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Home » Semiconductor (PCB) » Inspection


We offer a great product range covering inspection wavelengths from UV to IR. This range includes lamps for layer thickness measurements as well as lamps for defect detection. No matter whether your inspection system is a standalone or an in-line one,  we have the right product for you.

Ushio’s latest brochures and product catalogues can be found on our downloads page. If you are ready to make a formal enquiry, please fill in the form on our contact page.

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